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Query: UMLS:C0267964 (PAA)
 2,561 document(s) hit in 31,850,051 MEDLINE articles (0.00 seconds)

Photon activation analysis was performed using a standard sediment SRM 1646a and the Bremsstrahlung X-ray from a LINAC at RPI. The selected electron energy was 50 MeV and the mean beam current was 80 microA. Using Internal Standard Method, the concentrations of Ni and Pb has been determined, the results agree well with the values given by National Institute of Standards and Technology (NIST). However, a large amount of Zr in SRM 1646a was discovered which was not in the NIST certificate. The concentration of Zr was also determined. Finally, the PAA sensitivities for Ca, Ti, As, Pb, Ce, Ni, Rb and Zr based on the present experimental conditions were presented.
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PMID:Photon activation analysis: a proof of principle using a NIST sediment standard and an electron accelerator at Rensselaer Polytechnic Institute 1100 88

The capabilities of neutron and photon activation analysis (NAA and PAA, respectively) for low-level determination of silicon in biological materials have been examined. Sensitivities of a variety of modes of NAA and PAA with radiochemical separation have been evaluated. Results are presented for silicon in reference materials CSRM 12-2-03 Lucerne, Bowen's Kale, NIST SRM-1571 Orchard Leaves, and NIST SRM-1515 Apple Leaves. The results were obtained by employing the 29Si(n,p)29Al reaction with fast reactor neutrons and the radiochemical procedure developed for aluminium separation. Possibilities of further improvement of the silicon determination limit down to the microg g(-1) level by employing NAA and PAA with radiochemical separation are outlined.
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PMID:Possibilities of low-level determination of silicon in biological materials by activation analysis. 1145 Dec 44

Atomic force microscope (AFM) is an analytical instrument which is used to study the surface structure and morphology of materials. The AFM can measure and observe samples either in air or liquid environment. However, the standard AFM requires a long time to acquire accurate images and data. In our work, the compressive sensing (CS) was applied in order to reduce the imaging time, lower the interactions between the probe and the sample, finally avoid sample damage in AFM. Three samples (PAA film, TGG1 grating and BOPP film) were used as the testing samples. Different image reconstruction algorithms (l1-ls, TVAL3, GPSR and IHT) were employed to reconstruct AFM image with different sampling rate. And various sampling patterns (Random Scan, Row Scan, SRM, Spiral Scan and Square-shape Scan) were used to obtain the undersampling data. A large number of experiments show that the choice of sampling pattern and image reconstruction algorithm has significant impact on the quality of the reconstructed images in AFM. Subsequently the reconstruction results of sample topographic images were analyzed and evaluated by the image quality indicators (PSNR and SSIM). The CS method can be used to obtain accurate images by reducing measurement data. It finally improves the measurement speed of AFM without cutting down the quality of AFM image.
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PMID:Optimal sampling and reconstruction of undersampled atomic force microscope images using compressive sensing. 2962 36